XRD Diffractometer LXRD-A10

Overview

XRD Diffractometer LXRD-A10 contains tube current up to 5 to 80 mA with a dimension 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm and are designed for quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications, This multipurpose diffractometers are all equipped with X-ray tuble of glass tube, ceramic tube, ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo) and is coupled with an auto-switching dual wavelength optic. It have Low maintenance, high performance system and designed with Horizontal Goniometer structure and proportional/Scintillation counters detector.

Specifications :

X-ray Tuble	Glass tube, Ceramic tube, Ripple Ceramic tube: Cu, Fe, Co, Cr, Mo etc., Power 2 kW
Focus Size	1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm
Stability	≤ 0.01 %
Tube Current	5 to 80 mA
Tube Voltage	10 to 60 kV
Rated Power	3 kW
Goniometer Structure	Horizontal (Ø to 2 Ø )
Radius of Diffraction	185 mm
Scanning Range	0 to 164
Scanning Speed	0.0012º to 70 º min
Maximum Resolving Speed	100 º / min
Scanning Mode	Ø to 2 Ø linkage, Ø, 2 Ø single action; continuous/stepping scanning
Angle Repeatable Accuracy	1 / 1000 º
Minimal Stepping Angle	1 / 1000 º
Detector	Proportional/Scintillation counters
Maximum Counting rate of Linearity	5 × 105 CPS (with the compensate function of dropout counting)
Energy Resolution Ratio	≤ 25 % (PC), ≤ 50 % (SC)
Counting Fashion	Differential Coefficient / integral, PHA automatically, Dead time regulate
Stability of System measure	≤ 0.01 %
Scattered Rays Dose	≤ 1 µ Sv/h (without X-ray protective device)
Instrument Integrative Stability	≤ 0.5 %
Dimension	1100 × 850 × 1750 mm
Weight	About 25 kg

Features :

• -  Diffractometer is equipped with X-ray tuble of glass tube, ceramic tube, and ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo)
• -  Coupled with an auto-switching dual wavelength optic
• -  Horizontal Goniometer structure
• -  Proportional/Scintillation counters detector
• -  For testing unknown samples it has phase identification and phase analysis for known mixed samples
• -  Crystal structure varies with temperature (high temperature vice versa) factor and chemical information tested by X-ray diffraction test device
• -  Equipped with programmable operation, integrated structure design with easy operation and well-designed outlook
• -  High throughput with high accuracy diffraction angle measurement
• -  Scanning range and Scanning speed are well design in equipment

Applications :

Best suited for the research and industrial product analysis with perfect combination of conventional analysis crucial measurement product and for academics and researchers in different application areas.