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Atomic force microscope LAFM-A10

Atomic force microscope LAFM-A10

Atomic force microscope LAFM-A10 comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It’s equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.



Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Scan angle Random angle
Maximum scan range X/Y axis: 20 µm, Z axis: 2 µm
Optical system/ Magnification of CCD Magnification: 4x, Resolution: 2.5 µm
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size Ø≤ 90 mm, H≤ 20 mm
Sample movement 0 to 20 mm
Pulse width of approaching motor 10 ± 2 ms
Scan rate 0.6 Hz to 4.34 Hz
Scanning control XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel 256×256, 512×512
Feedback type DSP digital feedback
Feedback sampling rate 64 KHz
PC connections: USB 2.0
Windows software Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion 415 × 410 × 545 mm
Net weight 40 kg
Gross Weight 50 kg


Software Features

2 types of sampling pixel for selection (256×256, 512×512)
Selection of an area of interest for sampling by executing scan area move and cut function
Scans sample in random angle at beginning
Adjustment of laser spot detection system in real time
Selection and setting for different color scanning images in palette
Supports linear average and offset calibration in real time for sample title
Supports scanner sensitivity calibration and electronic controller auto-calibration
Supports offline analysis and process of sample image


It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

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