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Atomic Force Microscope

Labtron Atomic Force Microscope features versatile operational modes for comprehensive sample analysis. They facilitate the transfer of a wide range of sample sizes and types for flexibility. They offer strong anti-vibration performance ensuring stable imaging and precise measurements. Our microscopes are equipped with optical observation systems to monitor the alignment of tips and samples. These units include laser detection and probe alignment for enhanced analysis.

Atomic force microscope LAFM-A10

  • Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
  • Scan angle : Random angle
  • Maximum scan range : X/Y axis: 20 µm, Z axis: 2 µm
  • Optical system/ Magnification of CCD : Magnification: 4x, Resolution: 2.5 µm
  • Resolution : X/Y axis: 0.2 nm, Z axis: 0.05 nm

Atomic force microscope LAFM-A11

  • Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
  • Scan angle : 0 to 360°
  • Maximum scan range : X/Y axis: 50 µm, Z axis: 5 µm
  • Optical system/ Magnification of CCD : Magnification: 10x, Resolution: 1 µm
  • Resolution : X/Y axis: 0.2 nm, Z axis: 0.05 nm