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Atomic Force Microscope

Atomic force microscope LAFM-A10

  • Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
  • Scan angle : Random angle
  • Maximum scan range : X/Y axis: 20 µm, Z axis: 2 µm
  • Optical system/ Magnification of CCD : Magnification: 4x, Resolution: 2.5 µm
  • Resolution : X/Y axis: 0.2 nm, Z axis: 0.05 nm

Atomic force microscope LAFM-A11

  • Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
  • Scan angle : 0 to 360°
  • Maximum scan range : X/Y axis: 50 µm, Z axis: 5 µm
  • Optical system/ Magnification of CCD : Magnification: 10x, Resolution: 1 µm
  • Resolution : X/Y axis: 0.2 nm, Z axis: 0.05 nm