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Atomic force microscope LAFM-A11

Atomic force microscope LAFM-A11

Atomic force microscope LAFM-A11 comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.

Catalog

Specifications

Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
Scan angle 0 to 360°
Maximum scan range X/Y axis: 50 µm, Z axis: 5 µm
Optical system/ Magnification of CCD Magnification: 10x, Resolution: 1 µm
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size Ø≤ 90 mm, H≤ 20 mm
Sample movement 0 to 20 mm
Pulse width of approaching motor 10 ± 2 ms
Scan rate 0.6 Hz to 4.34 Hz
Scanning control XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel 256×256, 512×512
Feedback type DSP digital feedback
Feedback sampling rate 64 KHz
PC connections: USB 2.0
Windows software Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion 700 × 500 × 460 mm
Net weight 50 kg
Gross Weight 87.4 kg

Features

Software Features

Captures & display multi-channel images at same time, observes profile map in real-time
Measures multiple curves like F-Z, F-RMS, RMS-Z 3
Execute move & cut functions of scan area, selects an area of interest
Scans sample in 0 to 360° angle range
Adjust laser spot detection system in real time
Selection and setting for different color scanning images in palette
Supports linear average and offset calibration in real time for sample title
Supports scanner sensitivity calibration and electronic controller auto-calibration
Supports offline analysis and process of sample image

Applications

It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

Atomic Force Microscope